Fault Models in Superconducting quantum circuits
Qifan Huang, Boxi Li, Minbo Gao, Mingsheng Ying

TL;DR
This paper introduces a fault model for superconducting quantum circuits that accurately reflects real fault behaviors, enabling effective fault detection and testing with reduced resources.
Contribution
It proposes a novel fault model tailored for superconducting quantum systems and demonstrates its effectiveness through fault simulation and testing strategies.
Findings
34 test repetitions detect 10% control noise
Fidelity benchmarks for incoherent faults
Minimal test patterns for coherent faults
Abstract
Fault models are indispensable for many EDA tasks, so as for design and implementation of quantum hardware. In this article, we propose a fault model for superconducting quantum systems. Our fault model reflects the real fault behavior in control signals and structure of quantum systems. Based on it, we conduct fault simulation on controlled-Z gate and quantum circuits by QuTiP. We provide fidelity benchmarks for incoherent faults and test patterns of minimal test repetitions for coherent faults. Results show that with 34 test repetitions a 10% control noise can be detected, which help to save test time and memory.
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Taxonomy
TopicsAdvancements in Semiconductor Devices and Circuit Design · Semiconductor materials and devices · Quantum Computing Algorithms and Architecture
