Elastic, piezoelectric coefficients, and internal frictions of a single alpha-quartz crystal determined by partial-electrode electromechanical impedance spectroscopy

TL;DR

This study accurately measures all elastic, piezoelectric coefficients, and internal frictions of a single alpha-quartz crystal using a novel partial-electrode impedance spectroscopy method, demonstrating advantages over traditional RUS techniques.

Contribution

The paper introduces a new PE-EMIS technique for precise characterization of quartz crystal properties, avoiding issues of mode misidentification and overestimation present in RUS.

Findings

PE-EMIS accurately determines eigenmodes up to 310kHz.

Clamping force in RUS causes significant overestimations.

PE-EMIS is more effective and convenient for crystal characterization.

Abstract

In this work, all the independent elastic coefficients, piezoelectric coefficients, and internal frictions of a single alpha-quartz crystal are determined using our recently proposed partial-electrode electromechanical impedance spectroscopy (PE-EMIS) at 25 centigrade. In PE-EMIS, the rectangular parallelepiped quartz sample with two small partial electrodes fabricated on a corner is self-excited/sensed. The conductance spectrum (equivalent to the resonance spectrum) measured by an impedance analyzer under a true free boundary condition is noiseless, allowing the first 100 eigenmodes ranging from 50 to 310kHz to be accurately fitted. To avoid mode misidentification, the off-plane displacement distributions of the quartz sample under different eigenmodes are determined using a scanned-laser vibrometer. The resonance spectrum measured using a commercial sandwich-like RUS apparatus is also presented for comparison, and the results show that the clamping force in sandwich-like RUS shifts the sample's resonance frequencies, causing 13% and 75% overestimations for the piezoelectric coefficients e11 and e14, respectively. In comparison to the RUS, our proposed PE-EMIS is more effective and convenient, and will be widely used for characterization of piezoelectric crystals.