Resolving stress state at crack tip to elucidate nature of elastomeric fracture
Zehao Fan, Shi-Qing Wang

TL;DR
This study uses spatial-temporal stress measurements at crack tips in elastomers to reveal new phenomenology, explain toughness invariance, and reinterpret fracture mechanics, advancing understanding of elastomeric fracture behavior.
Contribution
It introduces a novel stress analysis approach using polarized optical microscopy to uncover new insights into elastomeric fracture mechanics, including stress saturation zones and the role of specimen geometry.
Findings
Discovery of a stress saturation zone independent of stress intensity factor
Explanation of toughness as a material constant based on stress measurements
Reinterpretation of fracture energy balance considering specimen height and thickness
Abstract
Based on spatial-temporal resolved measurements of the stress field at crack tip based on polarized optical microscopy (str-POM), the stress analysis approach to elastomeric fracture uncovers new insights. We show new phenomenology in contrast to the standard description of linear elastic fracture mechanics (LEFM). First, str-POM measurements show emergence of a stress saturation zone whose dimension r_ss is independent of the stress intensity factor K. This elastic zone is plastic zone whose size would scale quadratically with K. The absence of stress divergence allows us to measure tip stress s_tip at the onset of fracture, identified as inherent material strength, i.e., s_tip(F) = s_F(inh). We are able to explain why LEFM applies well to elastomers, i.e., why toughness (either given as critical energy release rate Gc or critical stress intensity factor Kc) is a material constant, and…
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
Taxonomy
TopicsForce Microscopy Techniques and Applications · Ultrasonics and Acoustic Wave Propagation · Optical measurement and interference techniques
