Design and test results of different aluminum coating layers on the sCMOS sensors for soft X-ray detection
W.X. Wang, Z.X. Ling, C. Zhang, W.M. Yuan, and S.N. Zhang

TL;DR
This study compares different aluminum coating layers on sCMOS sensors for soft X-ray detection, assessing their optical, electrical, and durability performance to optimize sensor shielding.
Contribution
It introduces three aluminum coating designs on sCMOS sensors and evaluates their impact on optical transmission, noise, dark current, and durability, providing insights for improved X-ray sensor shielding.
Findings
200 nm aluminum layer achieves ~10-9 optical transmission at 660 nm
Aluminum coatings increase dark current at room temperature but not at -15°C
Coatings show no cracks after thermal and aging tests
Abstract
In recent years, tremendous progress has been made on complementary metal-oxide-semiconductor (CMOS) sensors for applications as X-ray detectors. To shield the visible light in X-ray detection, a blocking filter of aluminum is commonly employed. We designed three types of aluminum coating layers, which are deposited directly on the surface of back-illuminated sCMOS sensors during fabrication. A commercial 2k * 2k sCMOS sensor is used to realize these designs. In this work, we report their performance by comparison with that of an uncoated sCMOS sensor. The optical transmissions at 660 nm and 850 nm are measured, and the results show that the optical transmission reaches a level of about 10-9 for the 200 nm aluminum layer and about 10-4 for the 100 nm aluminum layer. Light leakage is found around the four sides of the sensor. The readout noise, fixed-pattern noise and energy resolution…
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Taxonomy
TopicsCCD and CMOS Imaging Sensors · Particle Detector Development and Performance · Advancements in Semiconductor Devices and Circuit Design
