Directional dark-field retrieval with single-grid x-ray imaging

TL;DR

This paper introduces an analytical method for directional dark-field x-ray imaging using a single-grid setup, enabling extraction of microstructural scattering directions and angles even with high noise levels, suitable for low-dose applications.

Contribution

The paper develops a novel analytical retrieval algorithm for directional dark-field imaging with a single-grid setup, capable of extracting anisotropic scattering parameters in noisy conditions.

Findings

Effective in high noise environments

Enables low dose imaging

Accurately retrieves scattering directions and angles

Abstract

Directional dark-field imaging is an emerging x-ray modality that is sensitive to unresolved anisotropic scattering from sub-pixel sample microstructures. A single-grid imaging set-up can be used to capture dark-field images by looking at changes in a grid pattern projected upon the sample. By creating analytical models for the experiment, we have developed a single-grid directional dark field retrieval algorithm that can extract dark-field parameters such as the dominant scattering direction, and the semi-major and -minor scattering angles. We show that this method is effective even in the presence of high image noise, allowing for low dose and time sequence imaging.