Tilting refractive x-ray lenses for fine-tuning their focal length
Rafael Celestre, Thomas Roth, Carsten Detlefs, Peng Qi, Marco, Cammarata, Manuel Sanchez del Rio, Raymond Barrett

TL;DR
This paper investigates tilted x-ray refractive lenses, modeling their effects on x-ray beams and demonstrating their potential for fine-tuning focal lengths in optical systems, validated through precise at-wavelength measurements.
Contribution
It introduces a model for tilted x-ray lenses validated by experimental measurements, enabling fine-tuning of focal lengths for improved optical design.
Findings
Model accurately predicts effects of lens tilting on x-ray beams
Tilting lenses allows precise focal length adjustments
Validated model enhances optical system design capabilities
Abstract
In this work, we measure and model tilted x-ray refractive lenses to investigate their effects on an x-ray beam. The modelling is benchmarked against at-wavelength metrology obtained with x-ray speckle vector tracking experiments (XSVT) at the BM05 beamline at the ESRF-EBS light source, showing very good agreement. This validation permits us to explore possible applications of tilted x-ray lenses in optical design: we demonstrate that tilting 1D lenses around their focusing direction can be used for fine-tuning their focal length with possible applications in beamline optical design.
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Taxonomy
TopicsAdvanced X-ray Imaging Techniques · Optical measurement and interference techniques · Advanced Measurement and Metrology Techniques
