General model for charge carriers transport in electrolyte-gated transistors
Marcos Luginieski, Marlus Koehler, Jose P. M. Serbena, Keli, F. Seidel

TL;DR
This paper introduces a comprehensive charge transport model for electrolyte-gated transistors that accounts for non-ideal behaviors, including percolation effects and trap distributions, successfully fitting experimental data for various device types.
Contribution
The model uniquely integrates 2D/3D percolation, trap effects, and variable accumulation layer thickness, advancing understanding of non-ideal transistor behaviors.
Findings
Model accurately fits experimental EGT data
Explains non-linear low-voltage output behavior
Highlights impact of traps and accumulation layer on mobility
Abstract
Inspired by experimental observations related to electrolyte-gated transistors (EGTs) where non-ideals behaviors are shown and not described by just one theoretical model, we proposed a charge carriers transport model able to describe the typical modes of operation profiles as well as some non-ideals ones from electrolyte-gated field effect transistors (EGOFETs) and organic electrochemical transistors (OECTs). Our analysis include the effect of 2D or 3D percolation transport (PT) and also the influence of a shallow exponential traps distribution on the transport. Under these considerations, a non-constant accumulation layer thickness along the channel can be formed. Such dependence was included into our model in the effective mobility parameter dependent on the accumulation thickness. The accumulation thickness can depict 2D or 3D PT or even a transition between them. This transition…
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Taxonomy
TopicsConducting polymers and applications · Organic Electronics and Photovoltaics · Advanced Memory and Neural Computing
