Emergence of large spin-charge interconversion at an oxidized Cu/W interface

TL;DR

This study reveals a highly efficient spin-charge interconversion at an oxidized Cu/WO$_x$ interface, which could significantly enhance the performance of spin-orbitronic devices like MESO logic.

Contribution

It uncovers the origin and quantifies the efficiency of SCI at the Cu/WO$_x$ interface, demonstrating its superior performance compared to other interfaces.

Findings

SCI occurs at the Cu/WO$_x$ interface with high efficiency.

The interfacial spin-loss conductance is temperature-independent.

The inverse Edelstein length is significantly larger than in other metal interfaces.

Abstract

Spin-orbitronic devices can integrate memory and logic by exploiting spin-charge interconversion (SCI), which is optimized by design and materials selection. In these devices, such as the magnetoelectric spin-orbit (MESO) logic, interfaces are crucial elements as they can prohibit or promote spin flow in a device as well as possess spin-orbit coupling resulting in interfacial SCI. Here, we study the origin of SCI in a Py/Cu/W lateral spin valve and quantify its efficiency. An exhaustive characterization of the interface between Cu and W electrodes uncovers the presence of an oxidized layer (WO$_x$). We determine that the SCI occurs at the Cu/WO$_x$ interface with a temperature-independent interfacial spin-loss conductance of $G_{||} \approx$ 20 $\times$ 10$^{13} \Omega^{-1}m^{-2}$ and an interfacial spin-charge conductivity $\sigma_{SC}=-$1610 $\Omega^{-1}cm^{-1}$ at 10 K ($-$830 $\Omega^{-1}cm^{-1}$ at 300 K). This corresponds to an efficiency given by the inverse Edelstein length $\lambda_{IEE}=-$0.76 nm at 10 K ($-$0.4 nm at 300 K), which is remarkably larger than in metal/metal and metal/oxide interfaces and bulk heavy metals. The large SCI efficiency at such an oxidized interface is a promising candidate for the magnetic readout in MESO logic devices.