Regulating electron diffraction direction with cylindrically symmetric rotating crystal

TL;DR

This paper introduces a novel InSiO film with a cylindrically symmetric rotational crystal structure that can control electron diffraction directions in SEM, revealing potential mechanisms beyond current theories.

Contribution

The study presents a new InSiO film with a unique rotational crystalline structure capable of directing electron diffraction independently of incident angle and energy.

Findings

InSiO film enables simultaneous morphology and Kikuchi pattern observation.

The crystal structure can control diffraction direction through rotational distribution.

Diffraction control is independent of incident electron angle and energy.

Abstract

We report a promising InSiO film that allows simultaneous observation of sample morphology and Kikuchi patterns in raster scan mode of scanning electron microscopy. This new experimental observation suggests potential mechanism beyond existing diffraction theories. We find by simulation that this material has a novel cylindrically symmetric rotational crystalline structure that can control the diffraction direction of electrons through a specific rotational distribution of crystal planes, while being independent of the angle and energy of incident electrons within a certain range.