Density control of GaN nanowires at the wafer scale using self-assembled SiN$_x$ patches on sputtered TiN(111)
Thomas Auzelle, Miriam Oliva, Philipp John, Manfred Ramsteiner, Lutz, Geelhaar, and Oliver Brandt

TL;DR
This study demonstrates a method to precisely control the density of GaN nanowires across wafer scales by using self-assembled SiN$_x$ patches on sputtered TiN(111), enabling tunable nanowire ensembles with uniformity.
Contribution
It introduces a novel density tuning technique for GaN nanowires via SiN$_x$ patch deposition on TiN substrates, bridging the gap between existing growth regimes.
Findings
Nanowire density can be tuned over three orders of magnitude.
GaN nanowires nucleate on SiN$_x$ patches, not the TiN surface.
Photoluminescence shows excitonic transitions with blue shift and broadening.
Abstract
The self-assembly of heteroepitaxial GaN nanowires using either molecular beam epitaxy (MBE) or metal-organic vapor phase epitaxy (MOVPE) mostly results in wafer-scale ensembles with ultrahigh ( m) or ultralow ( m) densities, respectively. A simple means to tune the density of well-developed nanowire ensembles between these two extremes is generally lacking. Here, we examine the self-assembly of SiN patches on TiN(111) substrates which are eventually acting as seeds for the growth of GaN nanowires. We first found that if prepared by reactive sputtering, the TiN surface is characterized by \{100\} facets for which the GaN incubation time is extremely long. Fast GaN nucleation is only obtained after deposition of a sub-monolayer of SiN atoms prior to the GaN growth. By varying the amount of pre-deposited SiN, the GaN nanowire density could be…
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Taxonomy
TopicsGaN-based semiconductor devices and materials · Ga2O3 and related materials · ZnO doping and properties
