Controlled generation and detection of a thermal bias in Corbino devices under the quantum Hall regime

TL;DR

This paper introduces an experimental method to generate and measure a thermal bias in Corbino devices under the quantum Hall regime, combining electrical heating, conductance measurements, and numerical simulations to analyze heat flow and thermoelectric effects.

Contribution

It presents a novel technique for controlled thermal bias generation and measurement in quantum Hall devices, validated by experiments and simulations.

Findings

Thermal bias can be precisely generated and measured in Corbino devices.

Experimental results align with numerical heat flow simulations.

Thermoelectric responses are consistent with previous theoretical predictions.

Abstract

We present an experimental technique to generate and measure a temperature bias in the quantum Hall effect of GaAs/AlGaAs Corbino samples. The bias is generated by injecting an electrical current at a central resistive heater and the resulting radial temperature drop is determined by conductance measurements at internal and external concentric rings. The experimental results agree with the predictions of numerical simulations of the heat flow through the substrate. We also compare these results with previous predictions based on the thermoelectric response of these devices