Certification of the maximally entangled state using non-projective measurements

TL;DR

This paper proposes a new method for certifying maximally entangled two-qubit states using non-projective measurements in a one-sided device-independent setting, addressing practical measurement challenges.

Contribution

It introduces a self-testing scheme utilizing three three-outcome extremal POVMs for certifying maximally entangled states, expanding the tools beyond projective measurements.

Findings

Scheme is robust against white noise

Uses non-projective measurements for certification

Applicable in one-sided device-independent scenarios

Abstract

In recent times, device-independent certification of quantum states has been one of the intensively studied areas in quantum information. However, all such schemes utilise projective measurements which are practically difficult to generate. In this work, we consider the one-sided device-independent (1SDI) scenario, and propose a self-testing scheme for the two-qubit maximally entangled state using non-projective measurements, in particular, three three-outcome extremal POVM's. We also analyse the robustness of our scheme against white noise.