Understanding the direct detection of charged particles with SiPMs
F. Carnesecchi, G. Vignola, N. Agrawal, A. Alici, P. Antonioli, S., Arcelli, F. Bellini, D. Cavazza, L. Cifarelli, M. Colocci, S. Durando, F., Ercolessi, A. Ficorella, C. Fraticelli, M. Garbini, M. Giacalone, A. Gola, D., Hatzifotiadou, N. Jacazio, A. Margotti, G. Malfattore
TL;DR
This paper investigates how SiPM sensors detect charged particles, showing that their increased response is mainly due to Cherenkov light in the protection layer, and analyzes how different layers affect response and timing.
Contribution
It provides new insights into the detection mechanism of charged particles by SiPMs, emphasizing the role of Cherenkov light and the impact of protection layer variations.
Findings
Response increase linked to Cherenkov light in protection layer
Sensor response varies with protection layer material
Timing properties depend on protection layer characteristics
Abstract
In this paper evidence that the increased response of SiPM sensors to the passage of charged particles is related mainly to Cherenkov light produced in the protection layer is reported. The response and timing properties of sensors with different protection layers have been studied.
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Taxonomy
TopicsRadiation Detection and Scintillator Technologies · Analytical Chemistry and Sensors · CCD and CMOS Imaging Sensors