Self- and Mutual Inductance of NbN and Bilayer NbN/Nb Inductors in Planarized Fabrication Process With Nb Ground Planes
Sergey K. Tolpygo, Evan B. Golden, Terence J. Weir, Vladimir, Bolkhovsky, and Ravi Rastogi

TL;DR
This paper reports on measurements of self- and mutual inductance in NbN and bilayer NbN/Nb inductors with Nb ground planes, demonstrating their potential for high-density superconducting digital electronics.
Contribution
It introduces a fabrication process for NbN and bilayer NbN/Nb inductors with tunable inductance and shows that mutual inductance is geometry-dependent, not superconducting property-dependent.
Findings
Mutual inductance is independent of superconducting properties within studied range.
Measured magnetic penetration depth is approximately 491 nm for NbN films.
Kinetic inductance indicates reduced superfluid density, likely due to carrier localization.
Abstract
We present measurements of the self- and mutual inductance of NbN and bilayer NbN/Nb inductors with Nb ground plane(s) fabricated in an advanced process for superconductor electronics developed at MIT Lincoln Laboratory. In this process, the signal traces of logic cell inductors are made either of a 200-nm NbN layer with =15 K or of an in-situ deposited NbN/Nb bilayer, replacing a 200-nm Nb layer M6 in the standard SFQ5ee process with nine superconducting layers. Nb ground planes were preserved to maintain a high level of interlayer shielding and low intralayer mutual coupling. A two-step patterning of the top Nb and the bottom NbN layers of the NbN/Nb bilayer allows to create inductors in a very wide range of linear inductance values, from low values ~ 0.4 pH/m typical for Nb geometrical inductors to ~ 35 pH/m typical to thin-film kinetic inductors. Mutual inductance of…
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Taxonomy
TopicsMetal and Thin Film Mechanics · Particle accelerators and beam dynamics · Silicon Carbide Semiconductor Technologies
