Learning Less Generalizable Patterns with an Asymmetrically Trained Double Classifier for Better Test-Time Adaptation
Thomas Duboudin (imagine), Emmanuel Dellandr\'ea, Corentin Abgrall,, Gilles H\'enaff, Liming Chen

TL;DR
This paper introduces a novel training method with a double classifier and a shortcut patterns avoidance loss to enhance the learning of diverse, less generalizable features, thereby improving test-time adaptation in domain generalization tasks.
Contribution
The paper proposes a new approach combining a pair of classifiers and a shortcut patterns avoidance loss to mitigate shortcut learning and improve test-time adaptation performance.
Findings
Improves state-of-the-art results on PACS and Office-Home benchmarks.
Enhances the effectiveness of test-time batch normalization.
Reduces reliance on shortcut learning phenomena.
Abstract
Deep neural networks often fail to generalize outside of their training distribution, in particular when only a single data domain is available during training. While test-time adaptation has yielded encouraging results in this setting, we argue that, to reach further improvements, these approaches should be combined with training procedure modifications aiming to learn a more diverse set of patterns. Indeed, test-time adaptation methods usually have to rely on a limited representation because of the shortcut learning phenomenon: only a subset of the available predictive patterns is learned with standard training. In this paper, we first show that the combined use of existing training-time strategies, and test-time batch normalization, a simple adaptation method, does not always improve upon the test-time adaptation alone on the PACS benchmark. Furthermore, experiments on Office-Home…
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Taxonomy
TopicsCOVID-19 diagnosis using AI · Advanced Neural Network Applications · Domain Adaptation and Few-Shot Learning
