Towards Developing and Analysing Metric-Based Software Defect Severity Prediction Model
Umamaheswara Sharma B, Ravichandra Sadam

TL;DR
This paper introduces a metric-based, semi-supervised machine learning model for predicting software defect severity, aiming to improve accuracy and project outcome estimation in critical software systems.
Contribution
It proposes a novel semi-supervised approach using self-training and decision trees, along with five project-specific measures to evaluate prediction impact on software projects.
Findings
Self-training effectively labels unlabelled defect data.
The model provides promising accuracy in severity classification.
Project-specific measures help assess prediction impact on project outcomes.
Abstract
In a critical software system, the testers have to spend an enormous amount of time and effort to maintain the software due to the continuous occurrence of defects. Among such defects, some severe defects may adversely affect the software. To reduce the time and effort of a tester, many machine learning models have been proposed in the literature, which use the documented defect reports to automatically predict the severity of the defective software modules. In contrast to the traditional approaches, in this work we propose a metric-based software defect severity prediction (SDSP) model that uses a self-training semi-supervised learning approach to classify the severity of the defective software modules. The approach is constructed on a mixture of unlabelled and labelled defect severity data. The self-training works on the basis of a decision tree classifier to assign the pseudo-class…
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Taxonomy
TopicsSoftware Engineering Research · Software Reliability and Analysis Research · Software System Performance and Reliability
