Early stages of polycrystalline diamond deposition: Laser reflectance at substrates with growing nanodiamonds

TL;DR

This study develops a Rayleigh scattering-based model to accurately monitor early nanodiamond growth during polycrystalline diamond deposition, revealing limitations of traditional continuous film models and enabling better growth rate estimation.

Contribution

The paper introduces a novel scattering model for early-stage nanodiamond growth, improving the interpretation of laser reflectance data over traditional continuous film assumptions.

Findings

The Rayleigh scattering model better fits early growth reflectance data.

Seed density estimates from the model match electron microscopy results.

Using the continuous film model early on can falsely suggest incubation periods.

Abstract

The chemical vapor deposition of polycrystalline diamond (PCD) films is typically done on substrates seeded with diamond nanoparticles. Specular laser reflectance and a continuous film model have been used to monitor the thickness of these films during their deposition. However, most seeds are isolated during the early stages of the deposition, which questions the utility of applying such a continuous film model for monitoring deposition before film formation. In this work, we present a model based on the Rayleigh theory of scattering for laser reflectance at substrates with growing nanodiamonds to capture the early stages of PCD deposition. The reflectance behavior predicted by our model differs from that of a continuous film, which is well-described by the continuous film model. This difference enlarges as the seed density used in our model decreases. We verify this trend experimentally by depositing diamond under identical conditions on substrates with various seed densities. A relation derived from our model is used to fit reflectance data from which seed densities are obtained that are proportional to those found with electron microscopy. We also show that relying on the continuous film model for describing the early stages of deposition can result in falsely deducing the existence of incubation, and that the continuous film model can be used safely beyond the early stages of deposition. Based on these findings, we delineate a robust method for obtaining growth rates and incubation periods from reflectance measurements. This work may also advance the general understanding of nanoparticle growth and formation.