Paraxial forward-scatter field analysis for a THz pulse traveling down a highly overmoded iris-line waveguide

TL;DR

This paper introduces a forward-scatter wave analysis method for THz pulses in overmoded iris-line waveguides, enabling transient and finite-length behavior analysis with faster computation than traditional eigensolution methods.

Contribution

It presents a novel forward-traveling wave model that captures transient dynamics and finite-length effects in iris-line waveguides, improving analysis speed and flexibility.

Findings

Predicts diffraction loss consistent with steady-state eigensolution

Analyzes transient wave evolution and mode settling

Offers faster computation compared to mode-matching methods

Abstract

Highly overmoded iris-line structures carry desirable features for the efficient transportation of THz radiation over long distances. Previous studies have analyzed the iris line, modeled approximately as a long open-resonator structure with thin screens, using methods such as Vainstein's impedance boundary condition or perturbative mode matching. The aim in those methods was to seek the eigensolution that represents the dominant (least lossy) propagation mode in a long iris-line structure at steady state. In this paper, a forward-traveling wave analysis is presented, wherein a short THz pulse paraxially traverses the oversized structure cell by cell, including the transient regime. The iris line's periodic discontinuities are analyzed in terms of forward-wave orthogonal mode decompositions, which are then used to build a 'forward-scatter' model (matrix) for each cell. The presented approach predicts a diffraction loss behavior that agrees with that of the eigensolution found by the previous analytical methods at the steady state for a long waveguide, but adds the ability of analyzing waveguides of finite lengths, showing transients as they evolve and settle to the dominant mode down the line, and offers numerical implementation speeds that are typically an order-of-magnitude faster than those previously reported for the mode-matching method. This approach may also be easily extended to analyze iris lines with mechanical imperfections (e.g. misalignments or aperiodic defects), allowing for investigations of performance sensitivity against manufacturing tolerances.