Bayesian inference of high-purity germanium detector impurities based on capacitance measurements and machine-learning accelerated capacitance calculations
Iris Abt, Christopher Gooch, Felix Hagemann, Lukas Hauertmann, Xiang Liu, Oliver Schulz, Martin Schuster

TL;DR
This paper introduces a Bayesian inference method utilizing machine learning and GPU-accelerated capacitance calculations to accurately determine impurity distributions in high-purity germanium detectors, improving understanding beyond limited manufacturer data.
Contribution
It presents a novel open-source Julia-based framework combining surrogate modeling, GPU acceleration, and Bayesian inference for impurity density estimation in germanium detectors.
Findings
Impurity density shows radial dependence in the tested detector.
Capacitance measurements can effectively infer impurity distributions.
The method enhances impurity characterization accuracy.
Abstract
The impurity density in high-purity germanium detectors is crucial to understand and simulate such detectors. However, the information about the impurities provided by the manufacturer, based on Hall effect measurements, is typically limited to a few locations and comes with a large uncertainty. As the voltage dependence of the capacitance matrix of a detector strongly depends on the impurity density distribution, capacitance measurements can provide a path to improve the knowledge on the impurities. The novel method presented here uses a machine-learned surrogate model, trained on precise GPU-accelerated capacitance calculations, to perform full Bayesian inference of impurity distribution parameters from capacitance measurements. All steps use open-source Julia software packages. Capacitances are calculated with SolidStateDetectorsjl, machine learning is done with Fluxjl and…
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Taxonomy
TopicsParticle Detector Development and Performance · Electron and X-Ray Spectroscopy Techniques · CCD and CMOS Imaging Sensors
