Impact of random alloy fluctuations on the carrier distribution in multi-color (In,Ga)N/GaN quantum well systems
Michael O'Donovan, Patricio Farrell, Julien Moatti, Timo Streckenbach,, Thomas Koprucki, Stefan Schulz

TL;DR
This study investigates how random alloy fluctuations influence carrier distribution in multi-quantum well LEDs, revealing that detailed atomistic modeling aligns well with experimental results and improves understanding of device design.
Contribution
The paper introduces an atomistic tight-binding model combined with localization landscape theory to accurately simulate alloy disorder effects on carrier distribution in (In,Ga)N/GaN quantum wells.
Findings
Carrier distribution depends heavily on quantum well microstructure.
Including alloy fluctuations aligns simulation results with experimental trends.
Virtual crystal approximation results contradict experimental data.
Abstract
In this work, we study the impact that random alloy fluctuations have on the distribution of electrons and holes across the active region of a (In,Ga)N/GaN multi-quantum well based light emitting diode (LED). To do so, an atomistic tight-binding model is employed to account for alloy fluctuations on a microscopic level and the resulting tight-binding energy landscape forms input to a drift-diffusion model. Here, quantum corrections are introduced via localization landscape theory and we show that when neglecting alloy disorder our theoretical framework yields results similar to commercial software packages that employ a self-consistent Schroedinger-Poisson-drift-diffusion solver. Similar to experimental studies in the literature, we have focused on a multi-quantum well system where two of the three wells have the same In content while the third well differs in In content. By changing…
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Taxonomy
TopicsGaN-based semiconductor devices and materials · Ga2O3 and related materials · Semiconductor Quantum Structures and Devices
