Overview of CNM LGAD results: Boron Si-on-Si and epitaxial wafers
Chiara Grieco, Luc\'ia Castillo Garc\'ia, Albert Doblas Moreno,, Evangelos Leonidas Gkougkousis, Sebastian Grinstein, Salvador Hidalgo, Neil, Moffat, Giulio Pellegrini, Jairo Villegas Dominguez

TL;DR
This paper presents a comprehensive characterization of CNM-fabricated LGAD sensors, including boron-doped epitaxial and Si-on-Si wafers, before and after neutron irradiation, focusing on electrical performance and timing resolution for high-energy physics applications.
Contribution
It provides new insights into the performance differences between epitaxial and Si-on-Si LGAD sensors, especially under irradiation, aiding their optimization for HL-LHC timing detectors.
Findings
Si-on-Si sensors with higher resistivity perform better.
Irradiation affects the inter-pad region behavior.
Epitaxial sensors show lower performance after irradiation.
Abstract
Low Gain Avalanche Detectors (LGADs) are n-on-p silicon sensors with an extra p-layer below the collection electrode which provides signal amplification. When the primary electrons reach the amplification region new electron-hole pairs are created that enhance the generated signal. The moderate gain of these sensors, together with the relatively thin active region, provide precise time information for minimum ionizing particles. To mitigate the effect of pile-up at the HL-LHC the ATLAS and CMS experiments have chosen the LGAD technology for the High Granularity Timing Detector (HGTD) and for the End-Cap Timing Layer (ETL), respectively. A full characterization of recent productions of LGAD sensors fabricated at CNM has been carried out before and after neutron irradiation up to 2.5 10 n/cm . Boron-doped sensors produced in epitaxial and Si-on-Si wafers have…
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Taxonomy
TopicsParticle Detector Development and Performance · Superconducting Materials and Applications · Advancements in Semiconductor Devices and Circuit Design
