Criticality-Based Quantum Metrology in the Presence of Decoherence
Wan-Ting He, Cong-Wei Lu, Yi-Xuan Yao, Hai-Yuan Zhu, Qing Ai

TL;DR
This paper investigates how quantum criticality can be used for metrology under decoherence, revealing that noise limits the divergence of measurement precision and proposing methods to mitigate these effects.
Contribution
It provides analytical insights into the behavior of inverted variance near quantum critical points under noise, including the effects of single- and two-photon relaxation.
Findings
Inverted variance converges over time due to noise, with a power-law increase near criticality.
Squeezing operations can improve measurement precision under decoherence.
Two-photon relaxation alters the behavior of inverted variance, weakening the benefits of criticality.
Abstract
Quantum metrology aims to use quantum resources to improve the precision of measurement. Quantum criticality has been presented as a novel and efficient resource. Generally, protocols of criticality-based quantum metrology often work without decoherence. In this paper, we address the issue whether the divergent feature of the inverted variance is indeed realizable in the presence of noise when approaching the QPT. Taking the quantum Rabi model (QRM) as an example, we obtain the analytical result for the inverted variance. We show that the inverted variance may be convergent in time due to the noise. When approaching the critical point, the maximum inverted variance demonstrates a power-law increase with the exponent -1.2, of which the absolute value is smaller than that for the noise-free case, i.e., 2. We also observe a power-law dependence of the maximum inverted variance on the…
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Taxonomy
TopicsQuantum Information and Cryptography · Quantum Mechanics and Applications · Quantum Computing Algorithms and Architecture
