Accurate quantification of lattice temperature dynamics from ultrafast electron diffraction of single-crystal films using dynamical scattering simulations
Daniel B. Durham, Colin Ophus, Khalid M. Siddiqui, Andrew M. Minor,, Daniele Filippetto

TL;DR
This paper develops and applies dynamical scattering models for ultrafast electron diffraction of single-crystal films, significantly improving the accuracy of lattice temperature measurements compared to traditional kinematical models.
Contribution
It introduces dynamical scattering models tailored for quantitative UED analysis, demonstrating their effectiveness on ultrafast laser-heated gold films and highlighting their importance for accurate structural parameter retrieval.
Findings
Dynamical models outperform kinematical models by tenfold in fitting UED patterns.
Lattice temperature rise matches predictions based on optical constants.
Fitting Debye-Waller factors yields underestimated temperature values.
Abstract
In ultrafast electron diffraction (UED) experiments, accurate retrieval of time-resolved structural parameters, such as atomic coordinates and thermal displacement parameters, requires an accurate scattering model. Unfortunately, kinematical models are often inaccurate even for relativistic electron probes, especially for dense, oriented single crystals where strong channeling and multiple scattering effects are present. This article introduces and demonstrates dynamical scattering models tailored for quantitative analysis of UED experiments performed on single-crystal films. As a case study, we examine ultrafast laser heating of single-crystal gold films. Comparison of kinematical and dynamical models reveals the strong effects of dynamical scattering within nm-scale films and their dependence on sample topography and probe kinetic energy. Applying to UED experiments on an 11 nm thick…
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Taxonomy
TopicsElectron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications · Surface and Thin Film Phenomena
