Frequency-domain probe beam deflection method for measurement of thermal conductivity of materials on micron length scale
Jinchi Sun, Guangxin Lv, and David G. Cahill

TL;DR
This paper introduces a frequency-domain probe beam deflection method for measuring thermal conductivity at micron scales, overcoming limitations of traditional thermoreflectance techniques by leveraging thermoelastic deformation signals.
Contribution
The authors develop an analytical model for probe beam deflection based on thermoelastic effects, enabling accurate thermal conductivity measurements without strict optical property constraints.
Findings
Achieves thermal conductivity measurements within 6% of accepted values.
Effective for materials from polymers to gold, spanning 0.1-300 W/(m K).
Reduces sensitivity to laser beam radii and coating requirements.
Abstract
Time-domain thermoreflectance (TDTR) and frequency-domain thermoreflectance (FDTR) have been widely used for non-contact measurement of anisotropic thermal conductivity of materials with high spatial resolution. However, the requirement of high thermoreflectance coefficient restricts the choice of metal coating and laser wavelength. The accuracy of the measurement is often limited by the high sensitivity to the radii of the laser beams. We describe an alternative frequency-domain pump-probe technique based on probe beam deflection. The beam deflection is primarily caused by thermoelastic deformation of the sample surface with a magnitude determined by the thermal expansion coefficient of the bulk material to measure. We derive an analytical solution to the coupled elasticity and heat diffusion equations for periodic heating of a multilayer sample with anisotropic elastic constants,…
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Taxonomy
TopicsThermography and Photoacoustic Techniques · Thermal properties of materials · Advanced Sensor Technologies Research
