A Hybrid Deep Learning Model-based Remaining Useful Life Estimation for Reed Relay with Degradation Pattern Clustering
Chinthaka Gamanayake, Yan Qin, Chau Yuen, Lahiru Jayasinghe,, Dominique-Ea Tan, Jenny Low

TL;DR
This paper introduces a hybrid deep learning approach combining degradation pattern clustering and a novel RULNet model to improve remaining useful life estimation for reed relays, outperforming traditional CNN and LSTM methods.
Contribution
It proposes a new hybrid model integrating degradation pattern clustering with an enhanced RULNet for more accurate RUL estimation of reed relays.
Findings
The hybrid model outperforms CNN and LSTM in RUL estimation accuracy.
Degradation pattern clustering effectively distinguishes different degradation behaviors.
The proposed method achieves lower root mean squared error on real reed relay data.
Abstract
Reed relay serves as the fundamental component of functional testing, which closely relates to the successful quality inspection of electronics. To provide accurate remaining useful life (RUL) estimation for reed relay, a hybrid deep learning network with degradation pattern clustering is proposed based on the following three considerations. First, multiple degradation behaviors are observed for reed relay, and hence a dynamic time wrapping-based -means clustering is offered to distinguish degradation patterns from each other. Second, although proper selections of features are of great significance, few studies are available to guide the selection. The proposed method recommends operational rules for easy implementation purposes. Third, a neural network for remaining useful life estimation (RULNet) is proposed to address the weakness of the convolutional neural network (CNN) in…
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Taxonomy
TopicsNon-Destructive Testing Techniques · Electrical Contact Performance and Analysis · Semiconductor materials and interfaces
MethodsMemory Network · Sigmoid Activation · Tanh Activation · Long Short-Term Memory
