Ultrahigh-Resolution Wireless Capacitance Readout Based on Single Real Mode in Perturbed Parity-Time-Symmetric Sandwich-Type Electronic Trimer

TL;DR

This paper introduces a novel wireless capacitance readout system leveraging perturbed PT-symmetry in an electronic trimer, achieving high resolution and wider measurement range without manual tuning, validated through theoretical analysis and experiments.

Contribution

It presents a new PT-symmetric wireless readout mechanism that operates without manual tuning, extending the application of non-Hermitian physics to practical sensor systems.

Findings

System exhibits single real mode in weak coupling regime

Wider capacitance readout range compared to standard PT-symmetry systems

Higher Q-factor than conventional methods

Abstract

High-performance interrogation of inductor-capacitor (LC) microsensor has been a long-standing challenge due to the limited size of the sensor. Parity-time (PT) symmetry, an intriguing concept originated from quantum physics, has been utilized to improve the spectral resolution and sensitivity of the conventional readout circuit, while the PT symmetry condition has to be satisfied. In this work, a sandwich-type wireless capacitance readout mechanism based on perturbed PT-symmetric electronic trimer without manual tuning of the reader circuit is proposed. Theoretical eigenvalue analysis by solving the system equations shows that the system exhibits single real mode in weak coupling regime whose eigenfrequency changes in response to the capacitance of the neutral resonator. Furthermore, the proposed readout system exhibits wider readout capacitance range compared to standard PT-symmetry-based system while retaining higher Q-factor compared to conventional readout method, which has been validated with the experimental prototype based on printed circuit board. Our work not only enriches the underlying theory of non-Hermitian physics, but also shows potential applications in scenarios where longer interrogation distance is required, such as implanted medical devices, parameter detection in harsh environment, etc.