Pixel centroid characterization with laser speckle and application to the Nancy Grace Roman Space Telescope detector arrays
Christopher M. Hirata, Christopher Merchant

TL;DR
This paper presents a novel speckle-based method to characterize pixel centroid offsets in infrared detector arrays for space telescopes, achieving sub-pixel accuracy and aiding in precise astronomical measurements.
Contribution
It introduces a speckle pattern projection technique to reconstruct pixel centroid offsets and assesses its effectiveness on real detector data.
Findings
Residual centroid offsets are approximately 0.0107 pixels RMS.
Quadratic fitting reduces residual offsets to about 0.0097 pixels RMS.
Method effectively distinguishes signal from noise in pixel offset measurements.
Abstract
The Nancy Grace Roman Space Telescope will use its wide-field instrument to carry out a suite of sky surveys in the near infrared. Several of the science objectives of these surveys, such as the measurement of the growth of cosmic structure using weak gravitational lensing, require exquisite control of instrument-related distortions of the images of astronomical objects. Roman will fly 4kx4k Teledyne H4RG-10 infrared detector arrays. This paper investigates whether the pixel centroids are located on a regular grid by projecting laser speckle patterns through a double slit aperture onto a non-flight detector array. We develop a method to reconstruct the pixel centroid offsets from the stochastic speckle pattern. Due to the orientation of the test setup, only x-offsets are measured here. We test the method both on simulations, and by injecting artificial offsets into the real images. We…
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
Taxonomy
TopicsCalibration and Measurement Techniques · Adaptive optics and wavefront sensing · Optical measurement and interference techniques
