RUAD: unsupervised anomaly detection in HPC systems
Martin Molan, Andrea Borghesi, Daniele Cesarini, Luca Benini, Andrea, Bartolini

TL;DR
This paper introduces RUAD, an unsupervised recurrent model for anomaly detection in HPC systems, outperforming existing methods by leveraging temporal data dependencies and LSTM architecture.
Contribution
The paper presents RUAD, a novel unsupervised anomaly detection model that effectively captures temporal dependencies, significantly improving detection performance over existing approaches.
Findings
RUAD achieves an AUC of 0.767 in unsupervised mode.
RUAD outperforms current state-of-the-art methods.
The approach is validated on a ten-month HPC system dataset.
Abstract
The increasing complexity of modern high-performance computing (HPC) systems necessitates the introduction of automated and data-driven methodologies to support system administrators' effort toward increasing the system's availability. Anomaly detection is an integral part of improving the availability as it eases the system administrator's burden and reduces the time between an anomaly and its resolution. However, current state-of-the-art (SoA) approaches to anomaly detection are supervised and semi-supervised, so they require a human-labelled dataset with anomalies - this is often impractical to collect in production HPC systems. Unsupervised anomaly detection approaches based on clustering, aimed at alleviating the need for accurate anomaly data, have so far shown poor performance. In this work, we overcome these limitations by proposing RUAD, a novel Recurrent Unsupervised Anomaly…
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
Taxonomy
TopicsAnomaly Detection Techniques and Applications · Network Security and Intrusion Detection · Software System Performance and Reliability
