Intellectual Property Evaluation Utilizing Machine Learning
Jinxin Ding, Yuxin Huang, Keyang Ni, Xueyao Wang, Yinxiao Wang and, Yucheng Wang

TL;DR
This paper presents a machine learning-based platform for evaluating intellectual property, aiming to improve traditional methods and expand business in the Greater Bay Area.
Contribution
It introduces a novel machine learning approach for IP evaluation and develops an online platform to enhance traditional assessment methods.
Findings
Successful development of an online IP evaluation platform
Plans for business expansion in the Greater Bay Area
Potential improvements over traditional IP valuation methods
Abstract
Intellectual properties is increasingly important in the economic development. To solve the pain points by traditional methods in IP evaluation, we are developing a new technology with machine learning as the core. We have built an online platform and will expand our business in the Greater Bay Area with plans.
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Taxonomy
TopicsIndustrial Vision Systems and Defect Detection · Intellectual Property and Patents
