Towards Augmenting Tip-Enhanced Nanoscopy with Optically Resolved Scanning Probe Tips
Jeremy Belhassen, Simha Glass, George A. Stanciu, Denis E. Tranca,, Zeev Zalevsky, Stefan G. Stanciu, Avi Karsenty

TL;DR
This paper advances tip-enhanced nanoscopy by developing specialized probes with known optical properties, aiming to improve imaging speed and accuracy in nanoscale optical characterization.
Contribution
It introduces a flexible framework for fabricating and modeling TEN probes with tailored optical properties, enhancing their performance and application scope.
Findings
Demonstrated fabrication of specialized TEN probes
Modeled optical properties of the new probes
Potential for improved imaging protocols
Abstract
A thorough understanding of biological species and of emerging nanomaterials requires, among others, their in-depth characterization with optical techniques capable of nano-resolution. Nanoscopy techniques based on tip-enhanced optical effects have gained over the past years tremendous interest given their potential to probe various optical properties with resolutions depending on the size of a sharp probe interacting with focused light, irrespective of the illumination wavelength. Although their popularity and number of applications is rising, tip-enhanced nanoscopy techniques (TEN) still largely rely on probes that are not specifically developed for such applications, but for Atomic Force Microscopy. This cages their potential in many regards, e.g. in terms of signal-to-noise ratio, attainable image quality, or extent of applications. In this article we place first steps towards…
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Taxonomy
TopicsForce Microscopy Techniques and Applications · Near-Field Optical Microscopy · Integrated Circuits and Semiconductor Failure Analysis
