Understanding the effects of charge diffusion in next-generation soft X-ray imagers
Eric D. Miller, Gregory Y. Prigozhin, Beverly J. LaMarr, Marshall W., Bautz, Richard F. Foster, Catherine E. Grant, Craig S. Lage, Christopher, Leitz, Andrew Malonis

TL;DR
This paper investigates how charge diffusion affects spectral response in next-generation soft X-ray imagers with thick detectors and small pixels, using simulations validated by lab and space data to inform detector design.
Contribution
It presents detailed simulations of charge diffusion effects in X-ray detectors, validated against real data, to guide design choices for future high-resolution X-ray imaging instruments.
Findings
Larger pixels and higher bias improve spectral response.
Reducing readout noise has a dominant impact on performance.
High-pixel-aspect-ratio devices pose measurement challenges.
Abstract
To take advantage of high-resolution optics sensitive to a broad energy range, future X-ray imaging instruments will require thick detectors with small pixels. This pixel aspect ratio affects spectral response in the soft X-ray band, vital for many science goals, as charge produced by the photon interaction near the entrance window diffuses across multiple pixels by the time it is collected, and is potentially lost below the imposed noise threshold. In an effort to understand these subtle but significant effects and inform the design and requirements of future detectors, we present simulations of charge diffusion using a variety of detector characteristics and operational settings, assessing spectral response at a range of X-ray energies. We validate the simulations by comparing the performance to that of real CCD detectors tested in the lab and deployed in space, spanning a range of…
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Taxonomy
TopicsAdvanced X-ray and CT Imaging · Medical Imaging Techniques and Applications · Advanced X-ray Imaging Techniques
