CLARION2-TRINITY: a Compton-suppressed HPGe and GAGG:Ce-Si-Si array for absolute cross-section measurements with heavy ions
T. J. Gray, J. M. Allmond, D. T. Dowling, M. Febbraro, T. T. King, S., D. Pain, D. W. Stracener, S. Ajayi, J. Aragon, L. Baby, P. Barber, C., Benetti, S. Bhattacharya, R. Boisseau, J. Gibbons, S. L. Tabor, V. Tripathi,, C. Wibisono, I. Wiedenhoever, L. Bignell, M. S. M. Gerathy

TL;DR
The paper presents CLARION2-TRINITY, a sophisticated detector array combining Compton-suppressed HPGe and GAGG:Ce scintillators for precise absolute cross-section measurements with heavy ions, featuring advanced design, characterization, and initial experimental results.
Contribution
It introduces a novel detector array with integrated GAGG:Ce scintillators and HPGe detectors, enabling high-rate, high-resolution measurements with enhanced particle identification and gamma-ray detection capabilities.
Findings
GAGG:Ce scintillators show excellent particle ID and radiation hardness.
Array achieves high efficiency and fast timing with waveform digitizers.
Initial experiments demonstrate effective particle and gamma-ray spectroscopy.
Abstract
The design and performance of a new Compton-suppressed HPGe and charged-particle array, CLARION2-TRINITY, are described. The TRINITY charged-particle array is comprised of 64 Cerium-doped Gadolinium Aluminium Gallium Garnet (GAGG:Ce) crystals configured into five rings spanning 7-54 degrees, and two annular silicon detectors that can shadow or extend the angular coverage to backward angles with minimal -ray attenuation. GAGG:Ce is a non-hygroscopic, bright, and relatively fast scintillator with a light distribution well matched to SiPMs. Count rates up to 40 kHz per crystal are sustainable. Fundamental characteristics of GAGG:Ce are measured and presented, including light- and heavy-ion particle identification (PID) capability, pulse-height defects, radiation hardness, and emission spectra. The CLARION2 array consists of up to 16 Compton-suppressed HPGe Clover detectors…
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Taxonomy
TopicsIon-surface interactions and analysis · Integrated Circuits and Semiconductor Failure Analysis · X-ray Spectroscopy and Fluorescence Analysis
