Andreev-like Reflection in the Pfaffian Fractional Quantum Hall Effect
Ryoi Ohashi, Ryota Nakai, Takehito Yokoyama, Yukio Tanaka, and Kentaro, Nomura

TL;DR
This paper investigates charge transport between Pfaffian fractional and integer quantum Hall edges, revealing an Andreev-like reflection in the strong tunneling regime and providing conductance formulas for different regimes.
Contribution
It introduces the concept of Andreev-like reflection in the Pfaffian fractional quantum Hall effect and derives conductance expressions for weak and strong tunneling regimes.
Findings
In the weak tunneling limit, conductance scales as V^{1/2}
In the strong tunneling limit, conductance approaches a constant with corrections
Andreev-like reflection appears in the strong tunneling regime
Abstract
We studied the tunnel transport between the edge of a Pfaffian fractional quantum Hall state and that of an integer quantum Hall state. Based on the duality argument between the strong and weak tunnelings, we found that an Andreev-like reflection appeared in the strong tunneling regime. We calculated the charge conductance in the weak and strong tunneling regimes for the low-voltage limit. In the weak tunneling limit, dI}/dV was proportional to with bias voltage and . By contrast, in the strong tunneling limit, was expressed by with a correction term. We expect that this condition can be realized experimentally at the point contact between a fractional quantum Hall state with and an integer quantum Hall state with .
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Taxonomy
TopicsQuantum and electron transport phenomena · Advancements in Semiconductor Devices and Circuit Design · Surface and Thin Film Phenomena
