Versatile Domain Mapping Of Scanning Electron Nanobeam Diffraction Datasets Utilising Variational AutoEncoders and Decoder-Assisted Latent-Space Clustering
Andy Bridger, William I. F. David, Thomas J. Wood, Mohsen Danaie,, Keith T. Butler

TL;DR
This paper presents a versatile, data-driven method using Variational AutoEncoders and clustering to generate domain maps from SEND datasets, aiding microstructural analysis without prior structural knowledge.
Contribution
It introduces a novel, agnostic workflow that leverages VAEs and clustering to produce microstructural domain maps from SEND data without needing prior crystal structure information.
Findings
Effective domain mapping across varied samples
No prior crystal structure knowledge required
Applicable to large SEND datasets
Abstract
Advancements in fast electron detectors have enabled the statistically significant sampling of crystal structures on the nanometre scale by means of Scanning Electron Nanobeam Diffraction (SEND). Characterisation of structural similarity across this length scale is key to bridging the gap between local atomic structure (using atomic resolution techniques such as High Resolution Scanning Transmission Electron Microscopy (HR-STEM)) and the macro-scale (using bulk techniques such as powder X-ray and neutron diffraction). The use of SEND technique allows for structural investigation of a broad range of samples, due to the techniques ability to operate with low electron dosage and its tolerance for sample thickness, relative to HR-STEM. This, coupled with the capacity for data collection over a wide areas and the automation of this collection, allows for statistically representative sampling…
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Taxonomy
TopicsMachine Learning in Materials Science · X-ray Diffraction in Crystallography
