Cryogenic ion trap system for high-fidelity near-field microwave-driven quantum logic

TL;DR

This paper presents a cryogenic ion trap system with integrated microwave resonator designed for high-fidelity quantum logic operations using near-field microwaves, demonstrating effective field control and ion trapping capabilities.

Contribution

The work introduces a novel cryogenic ion trap with an on-chip microwave resonator that nulls direct microwave coupling while enabling strong field gradients for entangling gates.

Findings

Microwave field mapped successfully using a single ion

Ion trapping lifetime characterized at cryogenic temperatures

Measured motional mode heating rates for one and two ions

Abstract

We report the design, fabrication, and characterization of a cryogenic ion trap system for the implementation of quantum logic driven by near-field microwaves. The trap incorporates an on-chip microwave resonator with an electrode geometry designed to null the microwave field component that couples directly to the qubit, while giving a large field gradient for driving entangling logic gates. We map the microwave field using a single $^{43}$Ca$^+$ ion, and measure the ion trapping lifetime and motional mode heating rates for one and two ions.