Understanding the degradation of a model Si-anode in Li-ion battery at the atomic-scale

TL;DR

This paper uses advanced cryo-atom probe tomography to analyze the atomic-scale degradation mechanisms of silicon anodes in lithium-ion batteries, aiming to improve their longevity.

Contribution

It introduces the application of cryo-atom probe tomography for detailed atomic-level analysis of Si-anodes and their interfaces, revealing degradation processes.

Findings

Atomic-scale insights into Si-anode degradation

Identification of interface changes during cycling

Potential pathways for improving Si-anode longevity

Abstract

Si-anodes have long been candidates thanks to an expected ten-fold increase in capacity compared to graphite. However, details of the mechanisms governing their degradation remain elusive, hindering science-guided development of long-lived Si-based anodes. Here we demonstrate how the latest developments in cryo-atom probe tomography enable the in-depth analysis of the electrode and electrolyte, and their interface at atomic-level.