Post-field ionization of Si clusters in atom probe tomography: A joint theoretical and experimental study
Ramya Cuduvally, Richard J. H. Morris, Giel Oosterbos, Piero Ferrari,, Claudia Fleischmann, Richard G. Forbes, Wilfried Vandervorst

TL;DR
This study combines theoretical and experimental methods to understand post-field ionization in atom probe tomography, aiming to resolve mass peak overlaps and improve compositional accuracy.
Contribution
It introduces a predictive approach based on Kingham PFI theory to analyze molecular ion charge states in APT, enhancing peak identification accuracy.
Findings
Kingham PFI theory effectively models Si cluster charge states.
Post-field ionization behavior varies with operating conditions.
Transferability of the model to different materials is demonstrated.
Abstract
A major challenge for Atom Probe Tomography (APT) quantification is the inability to decouple ions which possess the same mass/charge-state () ratio but a different mass. For example, and at ~75 Da or and at ~14 Da, cannot be differentiated without the additional knowledge of their kinetic energy or a significant improvement of the mass resolving power. Such mass peak overlaps lead to ambiguities in peak assignment, resulting in compositional uncertainty and an incorrect labelling of the atoms in a reconstructed volume. In the absence of a practical technology for measuring the kinetic energy of the field-evaporated ions, we propose and then explore the applicability of a post-experimental analytical approach to resolve this problem based on the fundamental process that governs the production of…
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Taxonomy
TopicsAdvanced Materials Characterization Techniques · Surface and Thin Film Phenomena · Hydrogen embrittlement and corrosion behaviors in metals
