Probing temperature-induced phase transitions at individual ferroelectric domain walls

TL;DR

This paper introduces a heated probe scanning microscopy method to study temperature-induced phase transitions at individual ferroelectric domain walls, revealing local thermal polarization dynamics in Sn2P2S6.

Contribution

The paper presents a novel heated probe PFM technique for probing phase transitions at single ferroelectric domain walls, expanding the capabilities of local ferroelectric studies.

Findings

Enabled local exploration of phase transitions at individual domain walls.

Identified strong and weak modulation regimes in thermal PFM.

Discussed future applications for multifunctional SPM measurements.

Abstract

Ferroelectric domain walls have emerged as one of the most fascinating objects in condensed matter physics due to the broad variability of functional behaviors they exhibit. However, the vast majority of domain walls studies have been focused on bias-induced dynamics and transport behaviors. Here, we introduce the scanning probe microscopy approach based on piezoresponse force microscopy (PFM) with a dynamically heated probe, combining local heating and local biasing of the material. This approach is used to explore the thermal polarization dynamics in soft Sn2P2S6 ferroelectrics, and allows for the exploration of phase transitions at individual domain walls. The strong and weak modulation regimes for the thermal PFM are introduced. The future potential applications of heated probe approach for functional SPM measurements including piezoelectric, elastic, microwave, and transport measurements are discussed.