Benchmarks for Industrial Inspection Based on Structured Light
Yuping Ye, Siyuan Chen, Zhan Song

TL;DR
This paper introduces benchmarks with specific criteria to evaluate the performance of structured light methods in industrial inspection tasks, enabling quick assessment of suitability for different applications.
Contribution
It proposes a comprehensive evaluation metric based on four criteria for assessing structured light devices in industrial inspection, validated through a TypeC pin needles inspection case.
Findings
The benchmark effectively differentiates device performance.
The evaluation metric covers flatness, length, height, and sphericity.
Validated with real-world inspection task.
Abstract
Robustness and accuracy are two critical metrics for industrial inspection. In this paper, we propose benchmarks that can evaluate the structured light method's performance. Our evaluation metric was learning from a lot of inspection tasks from the factories. The metric we proposed consists of four detailed criteria such as flatness, length, height and sphericity. Then we can judge whether the structured light method/device can be applied to a specified inspection task by our evaluation metric quickly. A structured light device built for TypeC pin needles inspection performance is evaluated via our metrics in the final experimental section.
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
Taxonomy
TopicsIndustrial Vision Systems and Defect Detection · Surface Roughness and Optical Measurements · Optical measurement and interference techniques
