Using Neural Networks for Novelty-based Test Selection to Accelerate Functional Coverage Closure
Xuan Zheng, Kerstin Eder, Tim Blackmore

TL;DR
This paper introduces a neural network-based framework for test selection in simulation-based verification, significantly reducing simulation time to achieve high coverage efficiently.
Contribution
It presents a configurable, automated neural network framework for test selection that outperforms random methods in coverage closure speed and efficiency.
Findings
Up to 49.37% simulation reduction to reach 99.5% coverage
Neural network configurations outperform random selection
Computational overhead is negligible compared to simulation savings
Abstract
Novel test selectors used in simulation-based verification have been shown to significantly accelerate coverage closure regardless of the number of coverage holes. This paper presents a configurable and highly-automated framework for novel test selection based on neural networks. Three configurations of this framework are tested with a commercial signal processing unit. All three convincingly outperform random test selection with the largest saving of simulation being 49.37% to reach 99.5% coverage. The computational expense of the configurations is negligible compared to the simulation reduction. We compare the experimental results and discuss important characteristics related to the performance of the configurations.
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Taxonomy
TopicsVLSI and Analog Circuit Testing · Software Testing and Debugging Techniques · Real-time simulation and control systems
MethodsTest
