Data-Driven Model for Failure Analysis of Internet of Things Devices: A Preliminary Study

TL;DR

This paper introduces a preliminary data-driven failure analysis model for IoT devices using Bayesian networks to assess connection risks in LoRaWAN networks, aiming to determine device suitability.

Contribution

It develops a novel failure analysis model based on Bayesian belief networks for IoT devices in LoRaWAN networks, integrating multiple technological components.

Findings

The model calculates failure probabilities based on data transfer metrics.

Testing shows the model can predict connection failure risks.

Results assist in evaluating IoT device reliability.

Abstract

This paper proposes the preliminary study of the data-driven failure analysis model for the internet of things (IoT) devices. This model focus on the impact of data transferring both get and receiving data in class C of Low Power Wide Area Network (LoRaWAN). To set up the network, the authors develop the combination of four several technology parts, including 1) the End Device Gateway Network server of LoRa IoT, 2) an Application server for storing the data in the database, 3) the Dashboard to show and got the command by the user, and 4) the failure analysis model based on Bayesian belief networks which calculate the probability values that collect the data transferring both uplink and downlink on the network connection in this study. In the testing phase, the authors input the separated data into the data-driven failure analysis model to analyze the time and latency of the connection by the concern of the impact and risk of the failure of the overall system. The model will show the probability value of failure. The authors hope to use the results to clarify whether a tested IoT device is suitable for use or not.