FuSeBMC v4: Improving code coverage with smart seeds via BMC, fuzzing and static analysis
Kaled M. Alshmrany, Mohannad Aldughaim, Ahmed Bhayat, and Lucas C., Cordeiro

TL;DR
FuSeBMC v4 enhances software testing by synthesizing smart seeds through a hybrid approach combining BMC, fuzzing, and static analysis, leading to superior code coverage and bug detection.
Contribution
The paper introduces FuSeBMC v4, a novel test generator that synthesizes smart seeds to significantly improve code coverage in C programs using a hybrid BMC and fuzzing approach.
Findings
Outperformed all state-of-the-art tools in the Test-Comp 2022 competition.
Achieved higher code coverage and bug detection rates.
Received three awards for its performance.
Abstract
Bounded model checking (BMC) and fuzzing techniques are among the most effective methods for detecting errors and security vulnerabilities in software. However, there are still shortcomings in detecting these errors due to the inability of existent methods to cover large areas in target code. We propose FuSeBMC v4, a test generator that synthesizes seeds with useful properties, that we refer to as smart seeds, to improve the performance of its hybrid fuzzer thereby achieving high C program coverage. FuSeBMC works by first analyzing and incrementally injecting goal labels into the given C program to guide BMC and Evolutionary Fuzzing engines. After that, the engines are employed for an initial period to produce the so-called smart seeds. Finally, the engines are run again, with these smart seeds as starting seeds, in an attempt to achieve maximum code coverage / find bugs. During both…
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
Taxonomy
TopicsSoftware Testing and Debugging Techniques · Software Reliability and Analysis Research · Radiation Effects in Electronics
