Impact of interfaces on photoluminescence efficiency of high indium content InGaN quantum wells
Pawe{\l} Wolny, Henryk Turski, Grzegorz Muziol, Marta Sawicka, Julita, Smalc-Koziorowska, Joanna Moneta, Anna Feduniewicz-\.Zmuda, Szymon Grzanka,, Czes{\l}aw Skierbiszewski

TL;DR
This study demonstrates that staggered InGaN quantum wells improve photoluminescence efficiency by reducing defect formation and increasing luminescence, despite a decrease in wavefunction overlap, highlighting the importance of interface engineering.
Contribution
It reveals that inserting an intermediate In content layer in staggered QWs enhances luminescence efficiency by lowering defect density, a novel approach for high-In content InGaN QWs.
Findings
Staggered QWs increase luminescence intensity.
Reduced defect density observed in staggered QWs.
In composition difference controls defect formation.
Abstract
InGaN-based light emitting diodes (LEDs) are known to suffer from low electron and hole wavefunction overlap due to high piezoelectric field. Staggered InGaN quantum wells (QWs) have been proposed to increase the wavefunction overlap and improve the efficiency of LEDs especially for long wavelength emitters. In this work we evidence that the growth of staggered QWs has also another beneficial effect as it allows to reduce the formation of defects, responsible for nonradiative Shockley-Read-Hall recombination, at the bottom interface of the QW. Staggered QWs comprised an InGaN layer of an intermediate In content between the barrier and the QW. We show that insertion of such a layer results in a significant increase of the luminescence intensity, even if the calculated wavefunction overlap drops. We study the dependence of the thickness of such an intermediate In content layer on…
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Taxonomy
TopicsGaN-based semiconductor devices and materials · Metal and Thin Film Mechanics · Ga2O3 and related materials
