X-ray technological irradiation for TID studies on silicon sensor and electronic devices in a medical facility

TL;DR

This paper discusses how x-ray irradiation in medical facilities can be used for TID testing of silicon sensors and electronic devices, detailing the necessary setup and a case study at the Italian TIFPA-INFN Trento Center.

Contribution

It demonstrates the feasibility of conducting TID studies using medical x-ray facilities with minimal modifications, expanding testing options beyond specialized labs.

Findings

Successful SiPM x-ray irradiation campaign conducted in a medical facility.

Minimal instrumentation requirements identified for TID testing in non-specialized environments.

Potential for broader use of medical facilities for semiconductor radiation testing.

Abstract

Technological tests of Total Ionizing Dose effects are required not only for silicon particle sensors developed in high energy physics experiments, but also for electronic devices and semiconductor elements used in commercial, automotive and space applications. Using x-ray irradiators, these technological tests and studies can be performed not only in facilities explicitly built for this mission, but also in medical or biological research facilities when some minima requirements are satisfied. Generally this irradiation can be performed without interfering with the medical and biological activities of the facility. In this article will be described the minimum instrumentation required for this type of studies and will be given a detailed description of the preparation and realization of a SiPM x-ray irradiation campaign for TID characterization realized in the Italian TIFPA-INFN Trento Center Laboratory in May 2021, using instruments originally realized for medical and biological irradiation.