AFIA: ATPG-Guided Fault Injection Attack on Secure Logic Locking
Yadi Zhong, Ayush Jain, M. Tanjidur Rahman, Navid Asadizanjani,, Jiafeng Xie, and Ujjwal Guin

TL;DR
AFIA is a novel fault injection attack that efficiently breaks logic locking by sensitizing key bits to outputs with minimal fault injections, surpassing previous methods in effectiveness and complexity.
Contribution
This paper introduces AFIA, a fault injection attack guided by ATPG that can break any logic locking scheme relying on a secret key, with linear complexity and fewer faults than prior attacks.
Findings
AFIA requires only |K| test patterns to determine the key.
AFIA's fault injection complexity is linear with key size.
AFIA outperforms differential fault analysis in fault efficiency.
Abstract
The outsourcing of the design and manufacturing of integrated circuits has raised severe concerns about the piracy of Intellectual Properties and illegal overproduction. Logic locking has emerged as an obfuscation technique to protect outsourced chip designs, where the circuit netlist is locked and can only be functional once a secure key is programmed. However, Boolean Satisfiability-based attacks have shown to break logic locking, simultaneously motivating researchers to develop more secure countermeasures. In this paper, we present a novel fault injection attack to break any locking technique that relies on a stored secret key, and denote this attack as AFIA, ATPG-guided Fault Injection Attack. The proposed attack is based on sensitizing a key bit to the primary output while injecting faults at a few other key lines that block the propagation of the targeted key bit. AIFA is very…
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Taxonomy
TopicsPhysical Unclonable Functions (PUFs) and Hardware Security · Integrated Circuits and Semiconductor Failure Analysis · VLSI and Analog Circuit Testing
