High-resolution surface structure determination from bulk X-ray diffraction data

TL;DR

This paper presents a novel method to determine high-resolution surface charge density distributions from conventional bulk X-ray diffraction data, enabling surface structure analysis without surface-sensitive techniques.

Contribution

It introduces a new approach using aspherical charge density models to extract surface information from bulk XRD data, complementing existing surface-sensitive methods.

Findings

Validated on boron carbide surface structures

Identified correlation between surface charge density and functionality

Revealed electron deficient centers on certain surfaces

Abstract

The key to most surface phenomenon lies with the surface structure. Particularly it is the charge density distribution over surface that primarily controls overall interaction of the material with external environment. It is generally accepted that surface structure cannot be deciphered from conventional bulk X-ray diffraction data. Thus, when we intend to delineate the surface structure in particular, we are technically compelled to resort to surface sensitive techniques like High Energy Surface X-ray Diffraction (HESXD), Low Energy Electron Diffraction (LEED), Scanning Transmission Electron Microscopy (STEM) and Grazing Incidence Small Angle X-ray Scattering (GISAXS). In this work, using aspherical charge density models of crystal structures in different molecular and extended solids, we show a convenient and complementary way of determining high-resolution experimental surface charge density distribution from conventional bulk X-ray diffraction (XRD) data. The usefulness of our method has been validated on surface functionality of boron carbide. While certain surfaces in boron carbide show presence of substantial electron deficient centers, it is absent in others. Henceforth, a plausible correlation between the calculated surface structures and corresponding functional property has been identified.