Pushing compute and AI onto detector silicon
Antonino Miceli, Kazutomo Yoshii, Ian T. Foster

TL;DR
This paper discusses integrating AI and data processing directly into detector silicon chips to handle the massive data rates generated by next-generation X-ray imaging systems, enabling real-time analysis and reducing data transfer bottlenecks.
Contribution
It introduces the concept of embedding AI-based data compression and feature extraction within detector silicon to manage high data rates for advanced scientific imaging.
Findings
Highlights the data bandwidth challenge for next-gen detectors.
Proposes in-chip AI processing to reduce data volume.
Addresses the need for real-time data handling in scientific detectors.
Abstract
In order to take full advantage of the U.S. Department of Energy's billion-dollar investments into the next-generation research infrastructure (e.g., exascale, light sources, colliders), advances are required not only in detector technology but also in computing and specifically AI. Let us consider an example from X-ray science. Nanoscale X-ray imaging is a crucial tool to enable a wide range of scientific explorations from materials science and biology to mechanical and civil engineering. The next-generation light sources will increase the X-ray beam brightness and coherent flux by 100 to 1,000 times. In order to image larger samples, the continuous frame rate of pixel array detectors must be increased, approaching 1 MHz, which requires several Tbps (aggregated) to transfer pixel data out to a data acquisition system. Using 65-nm CMOS technology, an optimistic raw data rate off such a…
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Taxonomy
TopicsAdvanced X-ray and CT Imaging · Particle Detector Development and Performance · Medical Imaging Techniques and Applications
