Oxygen Hole Formation Controls Stability in LiNiO$_2$ Cathodes: DFT Studies of Oxygen Loss and Singlet Oxygen Formation in Li-Ion Batteries
A. R. Genreith-Schriever (1,5), H. Banerjee (1,2,5), A. S. Menon, (3,5), E. N. Bassey (1,4,5), L. F. Piper (3,5), C. P. Grey (1,5), A. J., Morris (2,5) ((1) Yusuf Hamied Department of Chemistry, University of, Cambridge, Cambridge, United Kingdom, (2) School of Metallurgy

TL;DR
This study uses DFT simulations to reveal how oxygen loss and singlet oxygen formation cause instability in LiNiO$_2$ cathodes, highlighting the role of oxygen redox and surface reactions in battery degradation.
Contribution
It provides detailed atomic-level insights into oxygen loss mechanisms and singlet oxygen formation in Ni-rich cathodes, supported by theoretical calculations and spectral analysis.
Findings
Oxygen loss occurs via peroxide formation and O$_2$ release at the surface.
Singlet oxygen is generated due to the peroxide ion’s singlet ground state.
High-voltage O $K$-edge features may indicate O-redox or water intercalation.
Abstract
Ni-rich cathode materials achieve both high voltages and capacities in Li-ion batteries but are prone to structural instabilities and oxygen loss via the formation of singlet oxygen. Using ab initio molecular dynamics simulations, we observe spontaneous O loss from the (012) surface of delithiated LiNiO, singlet oxygen forming in the process. We find that the origin of the instability lies in the pronounced oxidation of O during delithiation, i.e., O plays a central role in Ni O redox in LiNiO. For LiNiO, NiO, and the prototype rock salt NiO, density-functional theory and dynamical mean-field theory calculations based on maximally localised Wannier functions yield a Ni charge state of ca. +2, with O varying between -2 (NiO), -1.5 (LiNiO) and -1 (NiO). Predicted XAS Ni and O -edge spectra are in excellent agreement with experimental XAS spectra,…
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Taxonomy
TopicsElectron and X-Ray Spectroscopy Techniques · Advancements in Battery Materials · Semiconductor materials and devices
