Onset of pattern formation in thin ferromagnetic films with perpendicular anisotropy
Birger Brietzke, Hans Kn\"upfer

TL;DR
This paper analyzes the conditions under which pattern formation begins in ultrathin ferromagnetic films with perpendicular anisotropy, focusing on energy scaling and the critical regime for pattern emergence.
Contribution
It provides a mathematical analysis of the onset of pattern formation in thin ferromagnetic films, including energy scaling laws and bounds in the critical regime, which was not previously characterized.
Findings
Energy scales with film size and anisotropy parameter
BV-bound established in the critical regime
Pattern formation onset depends on rescaled film size
Abstract
We consider the onset of pattern formation in an ultrathin ferromagnetic film of the form for with preferred perpendicular magnetization direction. The relative micromagnetic energy is given by \begin{align} \mathcal{E}[M] &= \int_{\tilde{\Omega}_t} d^2 |\nabla M|^2+ Q \int_{\tilde{\Omega}_t} (M_1^2+M_2^2) + \int_{\mathbb{R}^3} |\mathcal{H}(M)|^2 - \int_{\mathbb{R}^3} |\mathcal{H}(e_3 \chi_{\tilde{ \Omega}})|^2, \end{align} describing the energy difference for a given magnetization with and the uniform magnetization . For , we establish the scaling of the energy and a BV-bound in the critical regime here the base area of the film is of order $|\tilde{ \Omega}| \sim (Q-1)^{1/2} d e^{\frac{2\pi…
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Taxonomy
TopicsMagnetic properties of thin films · Theoretical and Computational Physics · Advanced Mathematical Modeling in Engineering
