Development of an electron impact ion source with high ionization efficiency for future planetary missions
Oya Kawashima, Naho Yanase, Yoshihisa Okitsu, Masafumi Hirahara,, Yoshifumi Saito, Yuzuru Karouji, Naoki Yamamoto, Shoichiro Yokota, and, Satoshi Kasahara

TL;DR
This paper presents a new high-emission electron impact ion source with a Y2O3-coated iridium filament, achieving tenfold increased electron emission and ionization efficiency, suitable for future planetary mass spectrometry missions.
Contribution
The study introduces a novel EI ion source with a Y2O3-coated iridium filament that significantly enhances electron emission and ionization efficiency compared to previous models.
Findings
Electron emission exceeds 2 mA at 3.0 W power
Ionization efficiency reaches 10^4 nA/Pa
Demonstrated durability over 30 min * 100 cycles
Abstract
Ion sources using electron impact ionization (EI) methods have been widely accepted in mass spectrometry for planetary exploration missions because of their simplicity. Previous space-borne mass spectrometers were primarily designed with the EI method using rhenium tungsten alloy filaments, enabling up to 200 uA emission in typical cases. The emission level is desired to be enhanced because the sensitivity of mass spectrometers is a critical requirement for the future in situ mass spectrometry related to the measurement of trace components in planetary samples. In this study, we developed a new high-emission EI ion source using a Y2O3-coated iridium filament, which has a lower work function than rhenium tungsten alloy. The size of the ion source was 30 mm * 26 mm * 70 mm, and its weight was 70 g. We confirmed that when consuming 3.0 W power, the ion source emits more than 2 mA…
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